Discrete-time Integrated Circuits and Data converters
Aim
The aim of the course is to design and analyze switch-capacitor (SC) discrete-time circuits which form an outline for designing more complex mixed-signal blocks such as integrated architectures of analog-to-digital converters (ADC) and digital-to-analog converters (DAC). The continuous-time analog filters have also been outlined as band-select, anti-aliasing and reconstruction filters are important part of today's data converters.
Course Learning Outcome
At the end of the course, the passing students must be able to,
- perform charge redistribution analysis of switch-capacitor (SC) circuits and understand non-idealities caused by SC parasitic , op-amp and switches at system/transfer function level
- On-chip realization of continuous-time filters such as leapfrog, elliptical as active-RC or Gm-C filters
- Understand theoretical basics of ADC and DAC such as sampling and quantization,
- Describe the most important static and dynamic performance metrics for data converters and ADC/DAC architectures along with their advantages/disadvantages
- Describe key circuits implementation, main limiting factors for data-converters and their solutions for improvement
- Design an ADC or DAC for a practical application and simulating it at component level with advanced CAD/EDA tools
Course Contents
- Charge redistribution analysis for SC sample-and-hold circuits, SC accumulators and SC integrators, Noise and parasitic analysis, impact of finite bandwidth, gain, slew rate, dc offset and noise of opamp and on-resistance, charge injection and clock feed-through of switches
- An overview of continuous time filters and their on-chip realization as active-RC, Gm-C or OTA-C filters
- Fundamental of concepts of sampling, quantization, static and dynamic operation of data converters
- Nyquist-rate resistor based-, capacitor based- and current steering DAC architectures
- Nyquist-rate full-flash, folding and interpolation, SAR and pipeline ADC architectures
- An overview of circuits for data-converters
- Static method for testing DNL, INL; Testing of dynamic performance such as settling time, glitch and distortion, histogram method and use of sine wave and FFT for extracting specifications
- Oversampling techniques such as first and second order sampled sigma-delta modulators and noise shaping
Text book
- Franco Maloberti, "Data Converters," Springer
- Richard Schreier, Gabor C. Temes "Understanding Delta-Sigma Data Converters,"
- Rolf Schaumann and Mac E. Van Valkenburg, "Design of Analog Filters,"
|
Courses
|